摘要：

redox couple multilayer. Although UV spectra, ellipsometric measurements, and cyclic voltammogram suggest that the Zr-BPPI films grow uniformly, the atomic images of multilayer films are needed to confirm the uniformity of films. Therefore, the AFM measurement of Zr-BPPI films is being carried out to study film uniformity and growth on a microscopic level. In summary, it is shown that the layer thickness measured by ellipsometry linearly increases as a function of the number of layer deposited and UV-vis spectroscopic results of the deposition process are consistent with those of ellipsometric measurements. The average thickness of the film derived by ellipsometry was observed about 15.8 . Also, according to cyclic voltamogram, the quasi-reversible peak currents are systematically increased as the number of layer increases. These results indicate that the same amount of BPPI layer is placed on the substrate after each deposition cycle. Acknowledgment. This work was supported by the Ministry of Education (BSRI-96-3427)

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