Concept of a spectrometer for resonant inelastic X‐ray scattering with parallel detection in incoming and outgoing photon energies
摘要：
A spectrometer for resonant inelastic X-ray scattering (RIXS) is proposed where imaging and dispersion actions in two orthogonal planes are combined to deliver a full two-dimensional map of RIXS intensity in one shot with parallel detection at incoming hvin and outgoing hvout photon energies. Preliminary ray-tracing simulations with a typical undulator beamline demonstrate a resolving power well above 11000 with both hvin and hvout near 930 eV, with a vast potential for improvement. Combining this instrument – nicknamed hv2 spectrometer – with an X-ray free-electron laser source simplifies its technical implementation and enables efficient time-resolved RIXS experiments.
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DOI：
10.1107/S0909049509051097
被引量：
年份：
2010
国家科技图书文献中心
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掌桥科研
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