Substrate processing apparatus and method for manufacturing semiconductor device
申请(专利)号:
JP2014/057342
申请日期:
20140318
公开/公告号:
WO2014148490A1
申请(专利权)人:
国省代号:
WO
被引量:
摘要:
To provide a substrate processing apparatus formable of a conductive film, which is dense, includes low concentration of source-derived impurities and has low resistivity, at a higher film-forming rate, and a method for manufacturing a semiconductor device. ! The substrate processing apparatus includes a processing chamber configured to stack and accommodate a plurality of substrates; a first processing gas supply system configured to supply a first processing gas into the processing chamber; a second processing gas supply system configured to supply a second processing gas into the processing chamber; and a control unit configured to control the first processing gas supply system and the second processing gas supply system. At least one of the first processing gas supply system and the second processing gas supply system includes two nozzles which are vertically arranged in a stacking direction of the substrates and have different shapes, and the control unit is configured to supply at least one of the first processing gas and the second processing gas into the processing chamber through the two nozzles having different shapes when films are formed on the substrates by supplying the first processing gas and the second processing gas into the processing chamber at pulses having different film-forming rates. ! (C)2011,JPO&INPIT
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