摘要：

A new technique of measuring the X-ray "Pendellsung" intensity beats in white radiations diffracted from perfect single crystals has recently been developed in the authors' laboratory. In the present work an attempt was made to apply this technique to aluminium using parallel-sided single crystal specimens grown by the strain-anneal method. The atomic scattering factors, fhkl, for the eight low-order indices were determined from the extremum positions of the measured intensity beats on the basis of the dynamical diffraction theory. The scattering factor shows a linear increase with the wavelength in the range between 0.03 and 0.09 nm, which is attributed to the anomalous dispersion term, f′, as calculated by Cromer. The absolute atomic scattering factors, fhkl0, are evaluated by averaging the measured values of fhkl utilizing the Cromer's f′(λ) values and temperature factors of exp {0.8822×102(sinθλ)2}. The obtained fhkl0 values were very close to the theoretical ones calculated by the Hartree-Fock method for free atoms and also to those by Arlinghaus and by Cooper and Williams for atoms in crystalline solid.

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