摘要：

Measurements of the anisotropy of characteristic and continuum X-ray emission excited by 20-100 keV electrons are reported for single crystal films and bulk single crystals of gold. A modified theory of the X-ray emission can explain the observed independence of the anisotropy on the X-ray quantum energy, the decrease of anisotropy with increasing film thickness and the increase of anisotropy with increasing electron energy. The anisotropy of X-ray emission of bulk single crystals is of the order of 1%; however, values up to 50% have been observed with thin epitaxially grown gold films. The anisotropy can be neglected, therefore, in the microanalysis of bulk single crystal specimens. A quantitative microanalysis of epitaxial films in single crystal substrates however, has to consider this anisotropy.

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