Arrangement for surface testing (examination)
申请(专利)号:
DE3626724A
申请日期:
08/07/1986
公开/公告号:
DE3626724
公开/公告日期:
02/11/1988
申请(专利权)人:
SIEMENS AG
被引量:
摘要:
According to the invention, a doubly focused optical system having an ellipsoid of rotation is provided, one focal point (P1) of which is situated on the surface of the testpiece (2), in particular a glass substrate, and the other focal point (P2) of which is situated on the surface of a detector (6). The system is provided as a reflector (4) for the scattered radiation of the light beam (10), whose angle ( alpha ) of incidence is at most 25 DEG . This arrangement can be used to detect in a simple way dust particles adhering to the surface and having an extent of substantially less than 1 mu m.
展开
通过文献互助平台发起求助,成功后即可免费获取论文全文。
相似文献
参考文献
引证文献
研究点推荐
引用走势
辅助模式
引用
文献可以批量引用啦~
欢迎点我试用!