Atomic layer deposition of high k dielectric films
申请(专利)号:
AU20030254047
申请日期:
2003-07-21
公开/公告号:
AU2003254047A1
公开/公告日期:
2004-02-09
申请(专利权)人:
ASML US, INC.
被引量:
摘要:
A method of processing a semiconductor substrate includes reacting in a reactor a first reactant gas, evacuating the first reactant gas from the reactor, reacting a second reactant gas, and evacuating the second reactant gas. The reacting of the first reactant gas reacts the first reactant gas with an exposed surface of the semiconductor substrate in a reactor to convert the exposed surface into a solid mono-layer. The reacting of the second reactant gas reacts the second reactant gas with the solid mono-layer in the reactor to convert the solid mono-layer into a gaseous compound. The evacuating of the second reactant gas also evacuates the gaseous compound from the reactor.
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