Effect of Cluster Surface Energies on Secondary-Ion-Intensity Distributions from Ionic Crystals
摘要：
Ultrahigh-mass cluster ions (m/z>18 000) of the type (M(MX)/sub n/)/sup +/ have been produced by xenon-ion bombardment of CsI and detected by a high-performance secondary-ion mass spectrometer. The mass spectra (ion intensity versus n) show anomalous behavior which is correlated with hypothesized dominance of cubiclike clusters having low surface energies.
展开
关键词：
Experimental/ mass spectra molecular clusters/ cluster surface energies secondary-ion-intensity distributions ionic crystals high-performance secondary-ion mass spectrometer mass spectra cubiclike clusters/ A3520X Molecular mass spectra A3640 Atomic and molecular clusters
DOI：
10.1103/PhysRevLett.47.1046
被引量：
年份：
1981
通过文献互助平台发起求助，成功后即可免费获取论文全文。
相似文献
参考文献
引证文献
引用走势
辅助模式
引用
文献可以批量引用啦~
欢迎点我试用！
