Electrical transport studies of Ag nanoclusters embedded in glass matrix
摘要:
Silver nanoclusters embedded in glass matrices have been obtained by the combined use of ion exchange and subsequent ion implantation. XRD and UV-visible spectro-photometric analysis have confirmed the formation of Ag nano-clusters in the ion-irradiated samples. Temperature-dependent resistivity measurements of the irradiated samples have been found to follow ρ( T)∝exp√( T 0/ T) in the temperature range of 80–280 K. The observed behaviour of ρ( T) is consistent with charge transport due to hopping between isolated, conducting islands. The separation distance between the conducting islands has been found to be a function of fluence.
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关键词:
Experimental/ electrical resistivity hopping conduction ion exchange ion implantation metal clusters nanostructured materials silver ultraviolet spectra visible spectra X-ray diffraction/ electrical transport embedded Ag nanoclusters glass matrix ion exchange ion implantation XRD UV-visible spectrophotometry temperature-dependent resistivity measurements hopping isolated conducting islands separation distance 80 to 280 K Ag/ A7215 Electronic conduction in metals and alloys A7220F Low-field transport and mobility piezoresistance (semiconductors/insulators) A6180J Ion beam effects A7840K Visible and ultraviolet spectra of metals, semimetals, and alloys/ temperature 8.0E+01 to 2.8E+02 K/ Ag/el
DOI:
10.1016/S0921-4526(00)00580-9
被引量:
年份:
2001
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