Maximum entropy deconvolution of resonant inelastic x-ray scattering spectra
摘要：
Resonant inelastic x-ray scattering (RIXS) has become a powerful tool in the study of the electronic structure of condensed matter. Although the linewidths of many RIXS features are narrow, the experimental broadening can often hamper the identification of spectral features. Here, we show that the Maximum Entropy technique can successfully be applied in the deconvolution of RIXS spectra, improving the interpretation of the loss features without a severe increase in the noise ratio.
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关键词：
X-ray emission spectra and fluorescence X-ray scattering electron density of states and band structure of crystalline solids
DOI：
10.1103/PhysRevB.84.235111
被引量：
年份：
2011
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