The uv Absorption Edge of Tin Oxide Thin Films
摘要:
The absorption edge spectrum of thin films of SnO2has been obtained at room temperature using unpolarized light. The dependence of the absorption coefficient upon film resistivity has been noted and an impurity peak at about 3.4 eV has been observed. The measurements suggest an indirect edge near 2.7 eV and a direct edge near 4.3 eV.
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关键词:
Absorption spectra Absorption coefficient Electrical resistivity Ultraviolet spectra Visible spectra
DOI:
10.1063/1.1710208
被引量:
年份:
1967
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