Optical spectroscopy of Pr3+ ions in sol–gel derived GeO2–SiO2 planar waveguides
摘要：
A GeO 2 –SiO 2 planar waveguide, activated with 1% mol Pr 3+ , has been prepared using a dip-coating technique. The GeO 2 –SiO 2 film was deposited on a substrate consisting of a silicon wafer with a silica buffer layer. After annealing at 800°C and 900°C the waveguide luminescence and Raman spectra were measured. The Raman spectra show that complete densification is achieved after annealing at 800°C. Analysis of the emission spectra and the decay curves from the 3 P 0 and 1 D 2 states of Pr 3+ indicates that the non-radiative relaxation due to the rare-earth clustering is less important than in massive silica xerogels.
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DOI：
10.1016/S0022-3093(98)00857-6
被引量：
年份：
1999
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